FREMONT, Calif., March 29, 2012 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its ABTS Advanced Burn-in and Test System from a leading test lab in Korea. The system is configured for burning-in and testing high-power advanced logic devices.
"We are pleased to receive this order for an ABTS-Li system from a leading Korean test lab that is targeting reliability qualifications of high pin-count ICs requiring individual temperature control per device, such as mobile and tablet microprocessors," said Carl Buck, vice president of sales and marketing at Aehr Test Systems. "The ABTS system offers up to 256 universal pin drivers per device with up to 32 million test vectors per pin. Functional testing during burn-in helps ensure that the devices are receiving the proper stimulus during the entire reliability qualification process, which often lasts 6 weeks or longer. We expect the highly flexible and robust ABTS system to be an excellent fit for this environment."
The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it maximizes system uptime by using N+1 redundancy technology for many key components in the system.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOXTM and MAX systems and the DiePak® carrier. The ABTS system is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.